[Audio] Device Characterization with the Keithley 4200-SCS
Lee Stauffer
0 Plays
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
![[Audio] Device Characterization with the Keithley 4200-SCS - Podcasts](/_next/image?url=https%3A%2F%2Fnanohub.org%2Fsite%2Fresources%2F2011%2F01%2F10386%2Fitunes_audio.png&w=1920&q=75)
